Published November 2017 | Version v1
Journal article

Magneto-optical, structural and surface properties of RIB sputtered (Bi,Ga)-substituted DyIG films

  • 1. V. I. Vernadsky Crimean Federal University, Simferopol (Russian Federation)
  • 2. National Research University of Electronic Technology, Zelenograd, Moscow (Russian Federation)

Description

Highlights: • The dependences of properties of (Bi,Ga):DyIG films on GGG and CMZGGG substrates on the time of crystallization annealing were studied. • It was found that the films properties depend substantially on the substrate type and the time of crystallization annealing. • A minimal time of annealing to achieve the optimal parameters of the film was determined. - Abstract: The dependences of magneto-optical, structural and morphological properties of reactive ion beam sputtered (RIBS) nanoscale (Bi,Ga)-substituted DyIG [(Bi,Ga:DyIG)] films on (111) GGG and (111) CMZGGG substrates on the time of crystallization annealing were studied using Faraday effect measurements, X-ray diffraction and scanning atomic force microscopy. It was found that the roughness, degree of crystallinity and Faraday rotation angle of the films depend substantially on the substrate type and the time of crystallization annealing. It was determined a minimal time to achieve the optimal ratio between the measured magneto-optical and structural parameters of the film.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.materresbull.2017.06.036

Additional details

Identifiers

DOI
10.1016/j.materresbull.2017.06.036;
PII
S0025-5408(17)30936-4;

Publishing Information

Journal Title
Materials Research Bulletin
Journal Volume
95
Journal Page Range
p. 115-122
ISSN
0025-5408
CODEN
MRBUAC

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49081380
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL LATTICES; CRYSTALLIZATION; FARADAY EFFECT; FILMS; ION BEAMS; SPUTTERING; SUBSTRATES; X-RAY DIFFRACTION
Descriptors DEC
BEAMS; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; HEAT TREATMENTS; MICROSCOPY; PHASE TRANSFORMATIONS; SCATTERING

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.