Magneto-optical, structural and surface properties of RIB sputtered (Bi,Ga)-substituted DyIG films
Creators
- 1. V. I. Vernadsky Crimean Federal University, Simferopol (Russian Federation)
- 2. National Research University of Electronic Technology, Zelenograd, Moscow (Russian Federation)
Description
Highlights: • The dependences of properties of (Bi,Ga):DyIG films on GGG and CMZGGG substrates on the time of crystallization annealing were studied. • It was found that the films properties depend substantially on the substrate type and the time of crystallization annealing. • A minimal time of annealing to achieve the optimal parameters of the film was determined. - Abstract: The dependences of magneto-optical, structural and morphological properties of reactive ion beam sputtered (RIBS) nanoscale (Bi,Ga)-substituted DyIG [(Bi,Ga:DyIG)] films on (111) GGG and (111) CMZGGG substrates on the time of crystallization annealing were studied using Faraday effect measurements, X-ray diffraction and scanning atomic force microscopy. It was found that the roughness, degree of crystallinity and Faraday rotation angle of the films depend substantially on the substrate type and the time of crystallization annealing. It was determined a minimal time to achieve the optimal ratio between the measured magneto-optical and structural parameters of the film.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.materresbull.2017.06.036Additional details
Identifiers
- DOI
- 10.1016/j.materresbull.2017.06.036;
- PII
- S0025-5408(17)30936-4;
Publishing Information
- Journal Title
- Materials Research Bulletin
- Journal Volume
- 95
- Journal Page Range
- p. 115-122
- ISSN
- 0025-5408
- CODEN
- MRBUAC
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49081380
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL LATTICES; CRYSTALLIZATION; FARADAY EFFECT; FILMS; ION BEAMS; SPUTTERING; SUBSTRATES; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; HEAT TREATMENTS; MICROSCOPY; PHASE TRANSFORMATIONS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.