Published April 1, 2009 | Version v1
Journal article Metadata-only

Fabrication and properties of FePt thick films for alternative local field micromagnet

Creators

  • 1. Division of Applied Science, Cheongju University, Cheongju 360-764 (Korea, Republic of)
  • 2. Department of Display, Semiconductor and Physics, Korea University, Jochiwon 339-700 (Korea, Republic of)

Description

Growth of FePt films thicker than several tens of a micrometer was attempted on Fe substrates for the use of micromagnets. Several underlayer or intermediate layers were found to be totally ineffective to success. However, 20 μm thick FePt films on the Fe substrates were successfully grown by sputtering after HF surface treatment. (BH)max of the non-annealed film was about 10.7 MG Oe under a maximum applied field of 10 kOe. An excellent adhesion between the Fe substrate and the FePt thick films seems to be due to both improvement of surface cleanliness and roughening which enhanced the chemical and physical bonding strengths

Additional details

Identifiers

DOI
10.1063/1.3076055;

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
105
Journal Issue
7
Journal Page Range
p. 07A744-07A744.3
ISSN
0021-8979
CODEN
JAPIAU

Conference

Title
53. annual conference on magnetism and magnetic materials
Dates
10-14 Nov 2008
Place
Austin, TX (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40062405
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADHESION; ANISOTROPY; ANNEALING; BINARY ALLOY SYSTEMS; CRYSTAL GROWTH; DEPOSITION; IRON ALLOYS; LAYERS; PLATINUM ALLOYS; ROUGHNESS; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SUBSTRATES; SURFACE CLEANING; SURFACE TREATMENTS; THIN FILMS
Descriptors DEC
ALLOY SYSTEMS; ALLOYS; CLEANING; ELECTRON MICROSCOPY; FILMS; HEAT TREATMENTS; MICROSCOPY; PLATINUM METAL ALLOYS; SURFACE FINISHING; SURFACE PROPERTIES; TRANSITION ELEMENT ALLOYS

Optional Information

Notes
(c) 2009 American Institute of Physics