Superresolution size determination in fluorescence microscopy: A comparison between spatially modulated illumination and confocal laser scanning microscopy
- 1. Interdisciplinary Center for Scientific Computing (IWR), University of Heidelberg, D-69120 Heidelberg (Germany)
- 2. Applied Optics and Information Processing, Kirchhoff Institute for Physics (KIP), Im Neuenheimer Feld 227, D-69120 Heidelberg (Germany)
Description
Recently developed far field light optical methods are a powerful tool to analyze biological nanostructures and their dynamics, in particular including the interior of three-dimensionally conserved cells. In this article, the recently described method of spatially modulated illumination (SMI) microscopy has been further extended to the online determination of the extension of small, subwavelength sized, fluorescent objects (nanosizing). Using fluorescence excitation with 488 nm, the determination of fluorescent labeled object diameters down to 40 nm corresponding to about 1/12th of the wavelength used for one-photon excitation could be shown. The results of the SMI nanosizing procedure for a detailed, systematic variation of the object diameter are presented together with a fast algorithm for online size evaluation. In addition, we show a direct comparison of the diameter of 'colocalization volumes' between SMI nanosizing and conventional confocal laser scanning microscopy
Additional details
Identifiers
- DOI
- 10.1063/1.1751633;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 95
- Journal Issue
- 12
- Journal Page Range
- p. 8436-8443
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36038501
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; EXCITATION; FLUORESCENCE SPECTROSCOPY; ILLUMINANCE; NANOSTRUCTURES; OPTICAL MICROSCOPY; PHOTONS; VISIBLE RADIATION; WAVELENGTHS
- Descriptors DEC
- BOSONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EMISSION SPECTROSCOPY; ENERGY-LEVEL TRANSITIONS; EVALUATION; MASSLESS PARTICLES; MICROSCOPY; RADIATIONS; SPECTROSCOPY
Optional Information
- Notes
- (c) 2004 American Institute of Physics.