A nuclear technique for thin-lift gauging

A technique for measuring the density of a layer, or lift, of known and constant thickness (on the order of 1-10cm) on a planar substrate is developed. Two γ-ray backscatter gauge responses are required, one taken before the layer is applied, the other after. These two responses are related through a simple model from which the density of the layer can be determined. The technique has general applicability, but may be especially useful in the highway industry for thin-lift gauging of repaved surfaces. (author)