Multilayer optics for harmonic control of angiography beamline sources
- 1. Adelphi Technology, Inc., 2181 Park Blvd., Palo Alto, CA 94306 (United States)
- 2. Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Stanford, CA 94304 (United States)
Description
In recent work, multilayers with band-tailored optics for dual energy digital subtraction angiography (DDSA) applications have been designed and tested at SSRL. Control of various multilayer parameters, including period grading, ratio of high-to-low Z material thickness, number of layers, etc., was used to produce reflectors with bandwidths ranging from 0.6%endash 10% and efficiencies in the 30%endash 95% range. In this paper, we consider the control of multilayer bandshapes and the implementation of double-reflection multilayer configurations to further control the first harmonic (33 keV) bandwidth and to suppress or eliminate the 66 keV and 99 keV harmonics present on angiography beamlines driven by wiggler or micropole undulator sources. copyright 1996 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 67
- Journal Issue
- 9
- Journal Page Range
- p. 3357.
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- synchrotron radiation instrumentation symposium; 7. users meeting for the advanced photon source (APS).
- Acronym
- SRI '95
- Dates
- 16-20 Oct 1995.
- Place
- Argonne, IL (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28013796
- Subject category
- S43: PARTICLE ACCELERATORS; S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BIOMEDICAL RADIOGRAPHY; BRAGG REFLECTION; CONTROL; HEART; KEV RANGE 10-100; LAYERS; OPTICAL SYSTEMS; SYNCHROTRON RADIATION SOURCES; USES; WIGGLER MAGNETS; X-RAY DIFFRACTION; X-RAY EQUIPMENT; X-RAY RADIOGRAPHY; X-RAY SOURCES
- Descriptors DEC
- BODY; CARDIOVASCULAR SYSTEM; COHERENT SCATTERING; DIAGNOSTIC TECHNIQUES; DIFFRACTION; ENERGY RANGE; EQUIPMENT; KEV RANGE; MAGNETS; MEDICINE; ORGANS; RADIATION SOURCES; REFLECTION; SCATTERING
Optional Information
- Secondary number(s)
- CONF-9510119--.