Crystallographic polarity of ideomorphic faces on a cubic boron nitride single crystal determined by Rutherford backscattering spectroscopy
- 1. RIKEN, Inst. of Physical and Chemical Research, Saitama (Japan)
- 2. National Inst. for Research in Inorganic Materials, Ibaraki (Japan)
Description
The crystallographic polarity of ideomorphic {111} faces appearing on a cubic boron nitride (c-BN) single crystal grown with a temperature gradient method under an ultrahigh pressure of ≅ 55 kbar at a high temperature of ≅ 1800degC has been successfully determined with channeling experiments in Rutherford backscattering spectroscopy (RBS). Other methods such as the X-ray anomalous dispersion method are not applicable for this purpose because boron and nitrogen are light elements with atomic numbers close to each other. It has also been found with particle-induced X-ray emission (PIXE) that the c-BN single crystal contains molybdenum as an impurity (990 ppm), which is thought to have come from a molybdenum cell used in the temperature gradient method for growing the c-BN single crystal. The molybdenum atoms are not at specific lattice sites but at random sites. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research, Section B
- Journal Volume
- 45
- Journal Issue
- 1-4
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. B.
- Journal Page Range
- 208-211
- ISSN
- 0168-583X
- CODEN
- NIMBE
Conference
- Title
- 9. international conference on ion beam analysis (IBA-9).
- Dates
- 26-30 Jun 1989.
- Place
- Kingston (Canada).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 21068863
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BACKSCATTERING; BORON NITRIDES; CHANNELING; CRYSTALLOGRAPHY; CUBIC LATTICES; IMPURITIES; MOLYBDENUM ADDITIONS; MONOCRYSTALS; PIXE ANALYSIS; PRESSURE DEPENDENCE; PROTON BEAMS; RUTHERFORD SCATTERING; TEMPERATURE DEPENDENCE; VERY HIGH PRESSURE; X-RAY EMISSION ANALYSIS
- Descriptors DEC
- BEAMS; BORON COMPOUNDS; CHEMICAL ANALYSIS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; ELASTIC SCATTERING; NITRIDES; NITROGEN COMPOUNDS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; PNICTIDES; SCATTERING