Quantum well states and film structure
Creators
- 1. Institute of Physics and Physical Technology, Technical University Clausthal, D-38678 Clausthal-Zellerfeld (Germany)
- 2. Department of Physics, University of South Africa, P.O. Box 392, Pretoria 0003 (South Africa) and Institute of Mathematics and Physics, University of Podlasie, 3-go Maja 54, 08-110 Siedlce (Poland)
Description
Pronounced quantum size effects in photo-electron spectroscopy from 5 to 26 monolayer thick Au films deposited on Nb(1 0 0) occur only when the deposition is made at low temperatures (150 K). The low deposition temperature causes the long-range order of the frozen Au surface to be quite poor, making the film structure determination with standard methods such as RHEED or LEED impossible. Also techniques which do not need long-range order, such as X-ray photo-electron diffraction, cannot be used in this case to determine the structure of the Au films. The XPD measurements only show that the hexagonal dense-packed Au layers are situated perpendicularly to the substrate surface, but cannot reveal their stacking sequence. Using an ARUPS electron spectrometer and the properties of the quantum well states of the film we can determine, even in this case, the periodicity of the film states in the reciprocal space, and, consequently, the structure of the Au films. The structure turns out to be hexagonal (hcp and/or dhcp) and not fcc
Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2004.06.003;
- PII
- S0368-2048(04)00310-X;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 141
- Journal Issue
- 1
- Journal Page Range
- p. 13-26
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36044584
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DEPOSITION; ELECTRON DIFFRACTION; FCC LATTICES; FILMS; GOLD; HCP LATTICES; LAYERS; NIOBIUM; PERIODICITY; SUBSTRATES; SURFACES; TEMPERATURE RANGE 0065-0273 K; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; DIFFRACTION; ELECTRON SPECTROSCOPY; ELEMENTS; HEXAGONAL LATTICES; METALS; PHOTOELECTRON SPECTROSCOPY; REFRACTORY METALS; SCATTERING; SPECTROSCOPY; TEMPERATURE RANGE; TRANSITION ELEMENTS; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.