Published 2011 | Version v1
Miscellaneous

Problems of SIMS diagnostics of nanostructures on surface and in volume of solid matrices

  • 1. Inst. Fiziki Poluprovodnikov, Kiev (Ukraine)
  • 2. Inst. Geokhimii Okruzhayushchej Sredy, Kiev (Ukraine)

Description

no abstract available

Part of:
Summaries of reports of XLI International conference on physics of interactions of charged particles with crystals

Additional details

Additional titles

Original title (Russian)
Проблемы MSVI диагностики нанообьектов на поверхности и в обьеме твердотельных матриц

Publishing Information

Publisher
Universitetskaya kniga
Imprint Place
Moscow (Russian Federation)
Imprint Title
Summaries of reports of XLI International conference on physics of interactions of charged particles with crystals
Imprint Pagination
211 p.
Journal Page Range
p. 108
Report number
INIS-RU--526

Conference

Title
41. International conference on physics of interaction of charged particles with crystals
Original Conference Title
XLI mezhdunarodnaya konferentsiya po fizike vzaimodejstviya zaryazhennykh chastits s kristallami
Dates
31 May - 2 Jun 2011
Place
Moscow (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
43014861
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
No Abstract, Conference
Descriptors DEI
DEPTH; INCLUSIONS; ION SPECTROSCOPY; MASS SPECTROSCOPY; NANOSTRUCTURES; SECONDARY EMISSION; SILICON; SILICON OXIDES; SPATIAL DISTRIBUTION; STRUCTURAL CHEMICAL ANALYSIS
Descriptors DEC
CHALCOGENIDES; DIMENSIONS; DISTRIBUTION; ELEMENTS; EMISSION; OXIDES; OXYGEN COMPOUNDS; SEMIMETALS; SILICON COMPOUNDS; SPECTROSCOPY

Optional Information

Notes
Imprint:Tezisy dokladov XLI mezhdunarodnoj konferentsii po fizike vzaimodejstviya zaryazhennykh chastits s kristallami