A 30 mK, 13.5 T scanning tunneling microscope with two independent tips
Creators
- 1. Center for Nanophysics and Advanced Materials, Department of Physics, University of Maryland, College Park, Maryland 20740 (United States)
- 2. Laboratory for Physical Sciences, College Park, Maryland 20742 (United States)
Description
We describe the design, construction, and performance of an ultra-low temperature, high-field scanning tunneling microscope (STM) with two independent tips. The STM is mounted on a dilution refrigerator and operates at a base temperature of 30 mK with magnetic fields of up to 13.5 T. We focus on the design of the two-tip STM head, as well as the sample transfer mechanism, which allows in situ transfer from an ultra high vacuum preparation chamber while the STM is at 1.5 K. Other design details such as the vibration isolation and rf-filtered wiring are also described. Their effectiveness is demonstrated via spectral current noise characteristics and the root mean square roughness of atomic resolution images. The high-field capability is shown by the magnetic field dependence of the superconducting gap of CuxBi2Se3. Finally, we present images and spectroscopy taken with superconducting Nb tips with the refrigerator at 35 mK that indicate that the effective temperature of our tips/sample is approximately 184 mK, corresponding to an energy resolution of 16 μeV
Additional details
Identifiers
- DOI
- 10.1063/1.4871056;
- arXiv
- arXiv:1311.1855v2;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 85
- Journal Issue
- 4
- Journal Page Range
- p. 043706-043706.9
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45076110
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CONSTRUCTION; DESIGN; DILUTION; ENERGY RESOLUTION; IMAGES; MAGNETIC FIELDS; REFRIGERATORS; ROUGHNESS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY
- Descriptors DEC
- MICROSCOPY; RESOLUTION; SURFACE PROPERTIES
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC