Published January 1, 1976
| Version v1
Journal article
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Surface structure analysis by means of Rutherford scattering: methods to study surface relaxation
- 1. Stichting voor Fundamenteel Onderzoek der Materie, Amsterdam (Netherlands). Instituut voor Atoom en Molecuulfysica
Description
The use of Rutherford backscattering for structural analysis of single crystal surfaces is reviewed, and a new method is introduced. With this method, which makes use of the channeling and blocking phenomenon of light ions of medium energy, surface atoms can be located with a precision of 0.02 A. This is demonstrated in a measurement of surface relaxation for the Cu(110) surface. (Auth.)
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Additional details
Identifiers
Publishing Information
- Journal Title
- Nuclear Instruments and Methods
- Journal Volume
- 132
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 587-602
- ISSN
- 0029-554X
Conference
- Title
- 6. international conference on atomic collisions in solids.
- Dates
- 22 Sep 1975.
- Place
- Amsterdam, The Netherlands.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 7253542
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Is Lead record
- Yes
- Descriptors DEI
- BACKSCATTERING; COPPER; CRYSTAL STRUCTURE; ENERGY DEPENDENCE; ION CHANNELING; MONOCRYSTALS; RELAXATION; RUTHERFORD SCATTERING; SURFACES
- Descriptors DEC
- CHANNELING; CRYSTALS; ELASTIC SCATTERING; ELEMENTS; METALS; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent