Published March 15, 2008
| Version v1
Journal article
Indium adlayer kinetics on the gallium nitride (0001) surface: Monitoring indium segregation and precursor-mediated adsorption
Creators
- 1. Department of Physics, Duke University, Durham, North Carolina 27708 (United States)
- 2. Department of Electrical and Computer Engineering, Duke University, Durham, North Carolina 27708 (United States)
- 3. Institute of Inorganic Methodologies and of Plasmas-CNR, via Orabona, 4-70126 Bari (Italy)
Description
Indium kinetics and evidence for indium segregation on the GaN (0001) surface are investigated via in situ spectroscopic ellipsometry. Indium deposition exhibits two stable states at coverages of 1.0 and 1.7 ML within the temperature range of 630-688 deg. C. Formation of each layer is governed by two kinetic processes: nuclei formation and nuclei-mediated layer adsorption. The measured desorption activation energies of nuclei of the first (2.04 eV) and second (2.33 eV) monolayers are lower than the desorption activation energies of the aggregated first (2.64 eV) and second (2.53 eV) monolayers, respectively. This suggests that adatoms preferentially interact with the nuclei and laterally aggregate
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 77
- Journal Issue
- 11
- Journal Page Range
- p. 115435-115435.7
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40023029
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACTIVATION ENERGY; ADSORPTION; AGGLOMERATION; DEPOSITION; DESORPTION; ELLIPSOMETRY; EPITAXY; GALLIUM NITRIDES; INDIUM; KINETICS; LAYERS; SEGREGATION; SEMICONDUCTOR MATERIALS; SURFACES; TEMPERATURE RANGE 0400-1000 K
- Descriptors DEC
- CRYSTAL GROWTH METHODS; ELEMENTS; ENERGY; GALLIUM COMPOUNDS; MATERIALS; MEASURING METHODS; METALS; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; SORPTION; TEMPERATURE RANGE
Optional Information
- Notes
- (c) 2008 The American Physical Society