Published 2016
| Version v1
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Motte-Schottky electrodeposition and characterization of the CdTe on snox: F
Creators
- Moreira, R.L.1
- Freire, F.A.1
- Almeida, A.L.1
- Graca, M.F.1
- Lima, F.M.1
- Junior, P.F.M.1
- Martins, F.M.1
- Silva, A.N.1
- Teixeira, E.S.1
- Alencar, F.M.1
- Associacao Brasileira de Ceramica (ABCERAM), Sao Paulo, SP (Brazil)
- Associacao Brasileira de Metalurgia, Materiais e Mineracao (ABM), Sao Paulo, SP (Brazil)
- Associacao Brasileira de Polimeros (ABPol), Sao Carlos, SP (Brazil)
- 1. Universidade Federal do Ceara (UFCE), CE (Brazil)
Description
no abstract available
Files
49031433.pdf
Files
(17.3 kB)
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Additional details
Additional titles
- Original title (Portuguese)
- Eletrodeposicao e caracterizacao Mott-Schottky do CdTe sobre snox: F
Publishing Information
- Imprint Pagination
- 1 p.
- Report number
- INIS-BR--20085
Conference
- Title
- Brazilian congress of engineering and materials science
- Original Conference Title
- 22. CBECIMAT: congresso brasileiro de engenharia e ciencia dos materiais
- Acronym
- 22. CBECIMAT
- Dates
- 6-10 Nov 2016
- Place
- Natal, RN (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 49031433
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- CDTE SEMICONDUCTOR DETECTORS; DOPED MATERIALS; ELECTRODEPOSITION; FLUORINE; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TIN OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROLYSIS; ELECTRON MICROSCOPY; ELEMENTS; FILMS; HALOGENS; LYSIS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; NONMETALS; OXIDES; OXYGEN COMPOUNDS; RADIATION DETECTORS; SCATTERING; SEMICONDUCTOR DETECTORS; SURFACE COATING; TIN COMPOUNDS