Radioactive wastes selecting device and selection method therefor
Description
A captured γ-ray analyzer and a fluorescent X-ray analyzer are disposed in series. The captured γ-ray analyzer is constituted with a Ge detector and a neutron source. The fluorescent X-ray analyzer is constituted with an X-ray generator and an X-ray detector. For the analysis of captured γ-rays by irradiation of thermal neutrons, saturation caused by radiation rays from the radioactive wastes themselves is mitigated by a light element filter and a collimater. The fluorescent X-ray analysis is performed by a memory router in synchronization with the modulation of radiation source for the back ground correction. Radioactive wastes in the form of a plate are transferred while being loaded on a roller conveyor. Signal pulses measured by the Ge detector and the X-ray detector are stored in the form of an energy spectrum in a process memory by way of an amplifier and an AD convertor. Then, a photoelectronic peak counting rates are calculated respectively by a computer and they are inputted to an alarm generating circuit. (I.N.)
Availability note (English)
Available from JAPIO. Also available from EPO.Additional details
Publishing Information
- Imprint Pagination
- 12 p.
- IPC:
- Int. Cl. G21F9/36; G01N23/223; G01T1/167.
- IPC
- Int. Cl. G21F9/36; G01N23/223; G01T1/167.
- Patent number
- JP patent document 7-209493/A/
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 27023174
- Subject category
- S12: MANAGEMENT OF RADIOACTIVE WASTES, AND NON-RADIOACTIVE WASTES FROM NUCLEAR FACILITIES;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- GAMMA DETECTION; GAMMA RADIATION; GERMANIUM; MEASURING INSTRUMENTS; PHOTOELECTRON COUNTING; RADIOACTIVE WASTE PROCESSING; RADIOACTIVE WASTES; SOLID WASTES; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; COUNTING TECHNIQUES; DETECTION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; MANAGEMENT; MATERIALS; METALS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTION; RADIATIONS; RADIOACTIVE MATERIALS; WASTE MANAGEMENT; WASTE PROCESSING; WASTES; X-RAY EMISSION ANALYSIS
Optional Information
- Secondary number(s)
- JP patent application 6-1240.