Published November 1, 2007
| Version v1
Journal article
Electron source concept for single-shot sub-100 fs electron diffraction in the 100 keV range
Creators
- 1. Departments of Physics and Chemistry, McGill University, 3600 University St., Montreal, QC. H3A 2T8 (Canada)
- 2. Department of Applied Physics, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven (Netherlands)
Description
We present a method for producing sub-100 fs electron bunches that are suitable for single-shot ultrafast electron diffraction experiments in the 100 keV energy range. A combination of analytical estimates and state-of-the-art particle tracking simulations show that it is possible to create 100 keV, 0.1 pC, 30 fs electron bunches with a spot size smaller than 500 μm and a transverse coherence length of 3 nm, using established technologies in a table-top setup. The system operates in the space-charge dominated regime to produce energy-correlated bunches that are recompressed by radio-frequency techniques. With this approach we overcome the Coulomb expansion of the bunch, providing a single-shot, ultrafast electron diffraction source concept
Additional details
Identifiers
- DOI
- 10.1063/1.2801027;
- arXiv
- arXiv:physics/0702018v1;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 102
- Journal Issue
- 9
- Journal Page Range
- p. 093501-093501.8
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39079392
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- BEAM BUNCHING; COHERENCE LENGTH; ELECTRON DIFFRACTION; ELECTRON SOURCES; ELECTRONS; KEV RANGE 10-100; PARTICLE BEAMS; RADIOWAVE RADIATION; SIMULATION; SPACE CHARGE
- Descriptors DEC
- BEAM DYNAMICS; BEAMS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; DYNAMICS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; KEV RANGE; LENGTH; LEPTONS; MECHANICS; PARTICLE SOURCES; RADIATION SOURCES; RADIATIONS; SCATTERING
Optional Information
- Notes
- (c) 2007 American Institute of Physics