Published November 1, 2007 | Version v1
Journal article

Electron source concept for single-shot sub-100 fs electron diffraction in the 100 keV range

  • 1. Departments of Physics and Chemistry, McGill University, 3600 University St., Montreal, QC. H3A 2T8 (Canada)
  • 2. Department of Applied Physics, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven (Netherlands)

Description

We present a method for producing sub-100 fs electron bunches that are suitable for single-shot ultrafast electron diffraction experiments in the 100 keV energy range. A combination of analytical estimates and state-of-the-art particle tracking simulations show that it is possible to create 100 keV, 0.1 pC, 30 fs electron bunches with a spot size smaller than 500 μm and a transverse coherence length of 3 nm, using established technologies in a table-top setup. The system operates in the space-charge dominated regime to produce energy-correlated bunches that are recompressed by radio-frequency techniques. With this approach we overcome the Coulomb expansion of the bunch, providing a single-shot, ultrafast electron diffraction source concept

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
102
Journal Issue
9
Journal Page Range
p. 093501-093501.8
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2007 American Institute of Physics