Published 1990 | Version v1
Book

High resolution electron microscopy studies of faults and intergrowth in Nb3O7F

  • 1. Dept. of Inorganic Chemistry, Arrhenius Lab., Univ. of Stockholm, S-106 91 Stockholm (Sweden)

Description

This paper reports on HREM studies of the low- pressure form of Nb3O7F, obtained by thermal decomposition of NbO2F or by reacting stoichiometric amounts of NbO2F and Nb2O5. It confirmed that the crystals are built up of a shear-type structure in which slabs of ReO3 type, infinite in two dimensions and three octahedra wide, separate the shear planes. Most of the crystals were well-ordered, although faults could occasionally be detected. However, some crystals were found to be intergrown with a structure closely related to the high-pressure form of Nb3O7F. The latter structure is composed of wavy rows of edge-sharing Nb X7 pentagonal bipyramids, joined to each other by Nb X6 octahedra. The connection between the two atomic arrangements can be understood in terms of the common c-axes and a slight distortion of the polyhedra along the boundary

Additional details

Publishing Information

Publisher
Materials Research Society.
Imprint Place
Pittsburgh, PA (United States)
ISBN
1-55899-072-0
Imprint Title
High resolution electron microscopy of defects in materials
Imprint Pagination
391 p.
Journal Page Range
p. 305-310.

Conference

Title
Spring meeting of the Materials Research Society (MRS).
Dates
16-21 Apr 1990.
Place
San Francisco, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
23007192
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BOUNDARY CONDITIONS; CRYSTAL STRUCTURE; HIGH PRESSURE; NIOBIUM COMPOUNDS; RHENIUM OXIDES; STOICHIOMETRY
Descriptors DEC
CHALCOGENIDES; OXIDES; OXYGEN COMPOUNDS; RHENIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS

Optional Information

Secondary number(s)
CONF-900466--.