Published May 2008 | Version v1
Journal article

Partial dislocation configurations in a low-angle boundary in α-Al2O3

  • 1. Department of Materials Science, University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo 113-8656 (Japan)
  • 2. PRESTO, JST, 4-1-8, Honcho Kawaguchi, Saitama 332-0012 (Japan)
  • 3. Institute of Engineering Innovation, University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo 113-8656 (Japan)
  • 4. Department of Intelligent Materials Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshiku, Osaka 558-8585 (Japan)

Description

The dislocation structures of a low-angle tilt grain boundary in alumina bicrystal were investigated by transmission electron microscopy. The grain boundary was found to consist of two regions: an area with pairs of partial dislocations and an area with groups of odd numbered partial dislocations (multiple-partial-structure). Eight kinds of multiple-partial-structures were found in the fabricated grain boundary. The Burgers vectors of each partial dislocation in the grain boundary can be distinguished by dark-field imaging, and thus the arrangement of partial dislocations in the multiple-partial-structures are determined. It is concluded that a slight twist component of the boundary is the origin of the characteristic multiple-partial-structures

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2007.12.041

Additional details

Identifiers

DOI
10.1016/j.actamat.2007.12.041;
PII
S1359-6454(08)00013-X;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
56
Journal Issue
9
Journal Page Range
p. 2015-2021
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40011194
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALUMINIUM OXIDES; BURGERS VECTOR; CONFIGURATION; DISLOCATIONS; GRAIN BOUNDARIES; IMAGES; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ALUMINIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; LINE DEFECTS; MICROSCOPY; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.