Partial dislocation configurations in a low-angle boundary in α-Al2O3
- 1. Department of Materials Science, University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo 113-8656 (Japan)
- 2. PRESTO, JST, 4-1-8, Honcho Kawaguchi, Saitama 332-0012 (Japan)
- 3. Institute of Engineering Innovation, University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo 113-8656 (Japan)
- 4. Department of Intelligent Materials Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshiku, Osaka 558-8585 (Japan)
Description
The dislocation structures of a low-angle tilt grain boundary in alumina bicrystal were investigated by transmission electron microscopy. The grain boundary was found to consist of two regions: an area with pairs of partial dislocations and an area with groups of odd numbered partial dislocations (multiple-partial-structure). Eight kinds of multiple-partial-structures were found in the fabricated grain boundary. The Burgers vectors of each partial dislocation in the grain boundary can be distinguished by dark-field imaging, and thus the arrangement of partial dislocations in the multiple-partial-structures are determined. It is concluded that a slight twist component of the boundary is the origin of the characteristic multiple-partial-structures
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2007.12.041Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2007.12.041;
- PII
- S1359-6454(08)00013-X;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 56
- Journal Issue
- 9
- Journal Page Range
- p. 2015-2021
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40011194
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; BURGERS VECTOR; CONFIGURATION; DISLOCATIONS; GRAIN BOUNDARIES; IMAGES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; LINE DEFECTS; MICROSCOPY; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.