Size control of nanocrystalline magnetite thin films containing a small amount of Ge
- 1. Research Institute for Electric and Magnetic Materials, Sendai 982-0807 (Japan)
- 2. The Research Institute for Electric and Magnetic Materials, Sendai 982-0807 (Japan)
Description
This study investigated the preparation and particle size control of nanocrystalline magnetite (Fe3O4) containing a small amount of Ge. Thin films were prepared by radio-frequency sputtering with a composite target of Ge chips set on a Fe3O4 compound target in a mixed atmosphere of Ar and O2. X-ray diffraction revealed that the diffraction peak of magnetite gradually broadened as the oxygen ratio increased, with the mean grain size ranging from 26 to 2 nm. Transmission electron microscopy also revealed that the magnetite structurally changed from polycrystalline single phase to isolated granular nanocrystals. Magnetization at 8 x 105 A/m was monotonically reduced from 0.32 to 0.04 T, and coercivity was monotonically reduced from 4.2 x 104 to 2.1 x 103 A/m with increasing the oxygen ratio from 0 to 0.4%.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2010.04.070Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2010.04.070;
- PII
- S0040-6090(10)00603-6;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 518
- Journal Issue
- 20
- Journal Page Range
- p. 5690-5693
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- Materials Today Asia conference
- Dates
- 3-5 Sep 2007
- Place
- Beijing (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42060015
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COERCIVE FORCE; GERMANIUM; GRAIN SIZE; IRON OXIDES; MAGNETITE; MAGNETIZATION; NANOSTRUCTURES; PARTICLE SIZE; POLYCRYSTALS; SPUTTERING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; IRON COMPOUNDS; IRON ORES; METALS; MICROSCOPY; MICROSTRUCTURE; MINERALS; ORES; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SIZE; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.