Published 2016 | Version v1
Book Metadata-only

Simulation of the semiconductor gamma-ray spectrometer

Creators

  • 1. Moskovskij Gosudarstvennyj Univ. im. M.V. Lomonosova, Fizicheskij Fakul'tet, Moscow (Russian Federation)
  • 2. Nauchno-Issledovatel'skij Inst. Yadernoj Fiziki im. D.V. Skobel'tsina MGU, Moscow (Russian Federation)

Description

no abstract available

Part of:
LXVI International conference on problems of nuclear spectroscopy and structure of atomic nucleus «Nucleus-2016». Dedicated to 70th anniversary of Russian Federal Nuclear Center - VNIIEF. Abstracts

Additional details

Additional titles

Original title (Russian)
Моделирование полупроводникового гамма-спектрометра

Publishing Information

Publisher
Izdatel'stvo FGUP RFYaTs-VNIIEhF
Imprint Place
Sarov (Russian Federation)
ISBN
978-5-9515-0329-9
Imprint Title
LXVI International conference on problems of nuclear spectroscopy and structure of atomic nucleus #Left-Pointing Double Angle Quotation Mark#Nucleus-2016#Right-Pointing Double Angle Quotation Mark#. Dedicated to 70th anniversary of Russian Federal Nuclear Center - VNIIEF. Abstracts
Imprint Pagination
203 p.
Journal Page Range
p. 138, 139

Conference

Title
66. International conference on problems of nuclear spectroscopy and structure of atomic nucleus 'Nucleus-2016'
Original Conference Title
66-ya Mezhdunarodnaya konferentsiya po problemam yadernoj spektroskopii i strukture atomnogo yadra «Yadro-2016»
Dates
11-14 Oct 2016
Place
Sarov (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
50056226
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
No Abstract, Conference, Numerical Data
Descriptors DEI
CALIBRATION; COMPUTERIZED SIMULATION; DIAGRAMS; EFFICIENCY; GAMMA SPECTROMETERS; HIGH-PURITY GE DETECTORS; KEV RANGE 100-1000; KEV RANGE 10-100; THEORETICAL DATA
Descriptors DEC
DATA; ENERGY RANGE; GE SEMICONDUCTOR DETECTORS; INFORMATION; KEV RANGE; MEASURING INSTRUMENTS; NUMERICAL DATA; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SIMULATION; SPECTROMETERS

Optional Information

Notes
1 ref., 1 fig. Imprint:66-ya Mezhdunarodnaya konferentsiya po problemam yadernoj spektroskopii i strukture atomnogo yadra #Left-Pointing Double Angle Quotation Mark#Yadro-2016#Right-Pointing Double Angle Quotation Mark#. K 70-letiyu RFYaTs-VNIIEhF. Tezisy dokladov