Published June 2005 | Version v1
Journal article

Calibration of absolute spectral radiance in UV and VUV regions by using synchrotron radiation

  • 1. National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST), AIST Tsukuba Central 3, 1-1 Umezono 1-Chome, Tsukuba-shi, Ibaraki-ken 305-8563 (Japan)

Description

A synchrotron radiation was used as an absolute spectral radiance source in ultraviolet and vacuum ultraviolet regions and that scale was transferred to a deuterium lamp. A calibration system was used for comparing each spectral radiant flux. For the absolute calibration, it is important to determine the polarization dependence of the calibration system, because polarization of radiant flux is different between synchrotron radiation and the deuterium lamp. A polarimeter was introduced to determine the polarization dependence of our calibration system. The polarization dependence and that uncertainty of our system are calculated by using a new calculation method

Additional details

Identifiers

DOI
10.1016/j.elspec.2005.01.165;
PII
S0368-2048(05)00196-9;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
144-147
Journal Page Range
p. 1087-1091
ISSN
0368-2048
CODEN
JESRAW

Conference

Title
14. international conference on vacuum ultraviolet radiation physics
Acronym
VUV 14
Dates
19-23 Jul 2004
Place
Cairns (Australia)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37039939
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CALCULATION METHODS; CALIBRATION; DEUTERIUM; FAR ULTRAVIOLET RADIATION; LIGHT BULBS; POLARIMETERS; POLARIZATION; SYNCHROTRON RADIATION
Descriptors DEC
BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; HYDROGEN ISOTOPES; ISOTOPES; LIGHT NUCLEI; NUCLEI; ODD-ODD NUCLEI; RADIATIONS; STABLE ISOTOPES; ULTRAVIOLET RADIATION

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.