Published May 2002 | Version v1
Journal article Metadata-only

The application of hybrid integrated circuits in the large container inspect system

Creators

  • 1. Tsinghua Univ., Beijing (China). Dept. of Engineering Physics

Description

The author introduces the application of Hybrid Integrated Circuits (HIC) in the Large Container Inspect System. The specially devised HIC can not only reduce the volume of the system, but also improve the inherent reliability

Additional details

Publishing Information

Journal Title
Nuclear Electronics and Detection Technology
Journal Volume
22
Journal Issue
3
Journal Page Range
p. 260-262
ISSN
0258-0934

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
33061579
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CONTAINERS; INSPECTION; INTEGRATED CIRCUITS; RELIABILITY; SIGNAL-TO-NOISE RATIO
Descriptors DEC
ELECTRONIC CIRCUITS; MICROELECTRONIC CIRCUITS