Surface contact potential patches and Casimir force measurements
- 1. Yale University, Department of Physics, P.O. Box 208120, New Haven, Connecticut 06520-8120 (United States)
- 2. Theoretical Division MS B213, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
Description
We present calculations of contact potential surface patch effects that simplify previous treatments. It is shown that, because of the linearity of Laplace's equation, the presence of patch potentials does not affect an electrostatic calibration of a two-plate Casimir measurement apparatus. Using models that include long-range variations in the contact potential across the plate surfaces, a number of experimental observations can be reproduced and explained. For these models, numerical calculations show that if a voltage is applied between the plates which minimizes the force, a residual electrostatic force persists, and that the minimizing potential varies with distance. The residual force can be described by a fit to a simple two-parameter function involving the minimizing potential and its variation with distance. We show the origin of this residual force by use of a simple parallel capacitor model. Finally, the implications of a residual force that varies in a manner different from 1/d on the accuracy of previous Casimir measurements is discussed.
Additional details
Identifiers
- DOI
- 10.1103/PhysRevA.81.022505;
- arXiv
- arXiv:0905.3421v3;
Publishing Information
- Journal Title
- Physical Review. A
- Journal Volume
- 81
- Journal Issue
- 2
- Journal Page Range
- p. 022505-022505.7
- ISSN
- 1050-2947
- CODEN
- PLRAAN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42001382
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ACCURACY; CALIBRATION; CAPACITORS; CASIMIR EFFECT; DISTANCE; ELECTRIC POTENTIAL; PLATES; POTENTIALS; SURFACES; VARIATIONS
- Descriptors DEC
- ELECTRICAL EQUIPMENT; EQUIPMENT
Optional Information
- Notes
- (c) 2010 The American Physical Society