Published February 2016
| Version v1
Journal article
Producing multicharged fullerene ion beam extracted from the second stage of tandem-type ECRIS
Creators
- 1. Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita-shi, Osaka 565-0871 (Japan)
- 2. Bio-Nano Electronics Research Centre, Toyo University, 2100, Kujirai, Kawagoe-shi, Saitama 350-8585 (Japan)
- 3. Graduate School of Interdisciplinary New Science, Toyo University, 2100, Kujirai, Kawagoe-shi, Saitama 350-8585 (Japan)
- 4. National Institute of Radiological Sciences (NIRS), 4-9-1 Anagawa, Inage-ku, Chiba-shi, Chiba 263-8555 (Japan)
- 5. Faculty of Science and Engineering, Toyo University, 2100, Kujirai, Kawagoe-shi, Saitama 350-8585 (Japan)
Description
We have been constructing the tandem-type electron cyclotron resonance ion source (ECRIS). Two ion sources of the tandem-type ECRIS are possible to generate plasma individually, and they also confined individual ion species by each different plasma parameter. Hence, it is considered to be suitable for new materials production. As the first step, we try to produce and extract multicharged C60 ions by supplying pure C60 vapor in the second stage plasma because our main target is producing the endohedral fullerenes. We developed a new evaporator to supply fullerene vapor, and we succeeded in observation about multicharged C60 ion beam in tandem-type ECRIS for the first time
Additional details
Identifiers
- DOI
- 10.1063/1.4934644;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 87
- Journal Issue
- 2
- Journal Page Range
- vp.
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47052863
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AVAILABILITY; ECR ION SOURCES; FULLERENES; ION BEAMS; IONS; MATERIALS; PLASMA; VAPORS
- Descriptors DEC
- BEAMS; CARBON; CHARGED PARTICLES; ELEMENTS; FLUIDS; GASES; ION SOURCES; NONMETALS
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC