Published February 2016 | Version v1
Journal article

Producing multicharged fullerene ion beam extracted from the second stage of tandem-type ECRIS

  • 1. Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita-shi, Osaka 565-0871 (Japan)
  • 2. Bio-Nano Electronics Research Centre, Toyo University, 2100, Kujirai, Kawagoe-shi, Saitama 350-8585 (Japan)
  • 3. Graduate School of Interdisciplinary New Science, Toyo University, 2100, Kujirai, Kawagoe-shi, Saitama 350-8585 (Japan)
  • 4. National Institute of Radiological Sciences (NIRS), 4-9-1 Anagawa, Inage-ku, Chiba-shi, Chiba 263-8555 (Japan)
  • 5. Faculty of Science and Engineering, Toyo University, 2100, Kujirai, Kawagoe-shi, Saitama 350-8585 (Japan)

Description

We have been constructing the tandem-type electron cyclotron resonance ion source (ECRIS). Two ion sources of the tandem-type ECRIS are possible to generate plasma individually, and they also confined individual ion species by each different plasma parameter. Hence, it is considered to be suitable for new materials production. As the first step, we try to produce and extract multicharged C60 ions by supplying pure C60 vapor in the second stage plasma because our main target is producing the endohedral fullerenes. We developed a new evaporator to supply fullerene vapor, and we succeeded in observation about multicharged C60 ion beam in tandem-type ECRIS for the first time

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
87
Journal Issue
2
Journal Page Range
vp.
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47052863
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
AVAILABILITY; ECR ION SOURCES; FULLERENES; ION BEAMS; IONS; MATERIALS; PLASMA; VAPORS
Descriptors DEC
BEAMS; CARBON; CHARGED PARTICLES; ELEMENTS; FLUIDS; GASES; ION SOURCES; NONMETALS

Optional Information

Notes
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