Size and electron density of open-air plasmas diagnosed by optical imaging
- 1. State Key Laboratory of Advanced Optical Communication Systems and Networks, School of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240 (China)
- 2. Key Laboratory for Laser Plasmas (MoE), School of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240 (China)
- 3. School of Chemistry, Physics, and Mechanical Engineering, Queensland University of Technology, Brisbane, QLD 4000 (Australia)
Description
A method for accurate measurements of the size and electron density of open-air plasmas by optical imaging is developed. The plasma size is determined by the intensified charge coupled device (ICCD) imaging and is related to the plasma inductance. The plasma density is then derived from the plasma inductance in open air. The electron densities measured by the ICCD imaging agree well with the reliable Stark broadening method, in stark contrast with the commonly used current–voltage I– method. These shortcomings of the I– method arise because of its heavy reliance on electron mobility values which are uncertain in complex gas mixtures such as air. This work thus presents a new way of using the ICCD imaging to determine the plasma size and electron density and as such contributes to the development of next-generation plasma diagnostic methods. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6463/ab15ccAdditional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 52
- Journal Issue
- 26
- Journal Page Range
- [10 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52051964
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CHARGE-COUPLED DEVICES; DIAGNOSTIC TECHNIQUES; ELECTRIC CONDUCTIVITY; ELECTRON MOBILITY; PLASMA DENSITY; PLASMA DIAGNOSTICS
- Descriptors DEC
- ELECTRICAL PROPERTIES; MOBILITY; PARTICLE MOBILITY; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES