The Lund Nuclear Microprobe sub-micron set-up. Part II: Beam line, focusing system and scanning
Creators
- 1. Department of Nuclear Physics, Lund Institute of Technology, Lund University, P.O. Box 118, S-221 00 Lund (Sweden)
Description
A new beam line for generating a sub-micron beam spot for high-resolution nuclear microprobe applications has been constructed at the Lund Nuclear Microprobe facility. The design and construction of the beam line, the quality test of the four high precision Oxford OM-52 Quadrupole magnets by the grid shadow method and the beam scanning system are presented in this paper. The beam line is designed for a two-stage focusing system using an independent doublet at each stage. The first stage focuses the beam in an intermediate chamber, which has a scanning system and a high resolution viewing system. The beam spot in the intermediate chamber is then used as the object for the second stage. Slit construction, vacuum system and beam control is discussed. Data illustrating the quadrupole quality and scanning capability are shown
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.01.027;
- PII
- S0168-583X(05)00046-7;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 231
- Journal Issue
- 1-4
- Journal Page Range
- p. 7-13
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 9. international conference on nuclear microprobe technology and applications
- Acronym
- ICNMTA-2004
- Dates
- 13-17 Sep 2004
- Place
- Cavtat (Croatia)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37013782
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; BEAM FOCUSING MAGNETS; DESIGN; ENERGY RESOLUTION; FOCUSING; ION BEAMS; MICROANALYSIS; QUADRUPOLES; VACUUM SYSTEMS
- Descriptors DEC
- BEAMS; EQUIPMENT; MAGNETS; MULTIPOLES; RESOLUTION
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.