Measurement of K-shell fluorescence yields for the elements in the range 22 ≤ Z ≤ 52 excited by 14.4 and 122 keV photons

K-shell fluorescence yields were measured for the elements Ti, V, Co, Ni, Cu, Zn, As, Se, Sr, Y, Zr, Mo, Ag, Cd, In, Sn and Te excited by 14.4 and 122 keV photons from a 57Co source. A high resolution Si-PIN diode detector was used to detect the X-ray intensity. The measured values were compared with the theoretical, semi-empirical and other available experimental results. Good agreement with the theoretical, semi-empirical and other available measured values were observed within the experimental errors of 4%. In few cases a deviation up to 10% have been observed as compared to earlier measurements