Effect of Mo-W Co-doping on semiconductor-metal phase transition temperature of vanadium dioxide film
Creators
- 1. College of Material Science and Engineering, Sichuan University, Chengdu, Sichuan 610064 (China)
Description
Molybdenum and tungsten ions were doped into VO2 films by an aqueous sol-gel method. The effect of molybdenum and tungsten co-doping on semiconductor-metal transition of vanadium dioxide films is investigated, and it is compared with single molybdenum doped and undoped films. The composition and microstructure were detected by X-ray photoelectron spectroscopy, X-ray diffraction (XRD) and atomic force microscopy (AFM). The XRD patterns suggest that the prepared films are all strongly (011) oriented on muscovite (001) substrate at room temperature, attributing to the drive to minimize surface energy; and Mo-W codoping does not change the orientation of VO2 film on muscovite (001). It is inferred from the morphology by AFM that codoping induces a smaller grain size and a smoother surface. The infrared transmittance hysteresis cycles prove that codoping lowers phase transition temperature to a larger extent than single Mo doped films at the same doping level, with the change of optical transmittance below and above the phase transition temperature maintained. The positive effect of single molybdenum or tungsten doping on lowering phase transition temperature is enlarged when they were simultaneously added into VO2 films
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2008.05.021Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2008.05.021;
- PII
- S0040-6090(08)00567-1;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 516
- Journal Issue
- 23
- Journal Page Range
- p. 8554-8558
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40006134
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; DOPED MATERIALS; FILMS; GRAIN SIZE; HYSTERESIS; MOLYBDENUM; MORPHOLOGY; MUSCOVITE; PHASE TRANSFORMATIONS; SEMICONDUCTOR MATERIALS; SOL-GEL PROCESS; SURFACE ENERGY; TEMPERATURE RANGE 0273-0400 K; TRANSITION TEMPERATURE; TUNGSTEN; TUNGSTEN IONS; VANADIUM OXIDES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON SPECTROSCOPY; ELEMENTS; ENERGY; FREE ENERGY; IONS; MATERIALS; METALS; MICA; MICROSCOPY; MICROSTRUCTURE; MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; REFRACTORY METALS; SCATTERING; SILICATE MINERALS; SIZE; SPECTROSCOPY; SURFACE PROPERTIES; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; VANADIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.