Contribution of Stark-Doppler broadening of carbon impurity lines to the analysis of tokamak divertor plasmas
- 1. PIIM, UMR 7345 CNRS/Université d'Aix-Marseille, Campus de St. Jérôme, service 232, Av. Escadrille Normandie-Niemen, F-13397 Marseille Cedex 20 (France)
- 2. Japan Atomic Energy Agency, 801-1, Mukoyama, Naka, Ibaraki, 311-0193 (Japan)
Description
We investigate the broadening mechanisms affecting carbon lines emitted from tokamak divertor plasmas with an emphasis on the C IV n=6−7 (γ=772.6 nm) line. We show how line profiles can contribute to the spatial characterization of tokamak divertors providing high-resolution line spectra along viewing chords can be measured. For simplicity, we ignore the Zeeman effect by considering only Doppler and Stark broadenings in the calculations. Therefore these calculations, which ignore the magnetic field effect, can be compared to spectra measured with the use of a linear polarizer transmitting only the π component whose polarization is parallel to the toroidal magnetic field. Comparison of theoretical profiles to high-resolution measured C IV n=6–7 line spectra allow the determination of the several plasma parameters.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/397/1/012025Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 397
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 21. international conference on spectral line shapes
- Acronym
- ICSLS 2012
- Dates
- 3-9 Jun 2012
- Place
- St. Petersburg (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44043005
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON; CARBON IONS; COMPARATIVE EVALUATIONS; DIVERTORS; DOPPLER BROADENING; EMISSION SPECTRA; LINE WIDTHS; MAGNETIC FIELDS; PLASMA; PLASMA DIAGNOSTICS; PLASMA IMPURITIES; POLARIZATION; RESOLUTION; STARK EFFECT; TOKAMAK DEVICES; ZEEMAN EFFECT
- Descriptors DEC
- CHARGED PARTICLES; CLOSED PLASMA DEVICES; ELEMENTS; EVALUATION; IMPURITIES; IONS; LINE BROADENING; NONMETALS; SPECTRA; THERMONUCLEAR DEVICES