Published 1990 | Version v1
Book Metadata-only

Critical current density and microstructure of YBa2Cu3O7-x films as a function of film thickness

Creators

  • 1. General Electric Co., Schenectady, NY (United States). Corporate Research and Development Center

Description

Thin films of nominal composition YBa2Cu3O7-x (YBCO) were produced on (100) SrTiO3 substrates by coevaporation and furnace annealing. Film thicknesses in the range of 0.2 to 2.4 μm were analyzed. Microstructural investigations by cross sectional transmission electron microscopy (TEM) reveal a continuous layer of about 0.4 μm thickness adjacent to the substrate with c-axis normal to the substrate plane. In thicker films the remaining top portion has the c-axis in the film plane. The critical current density (Jc) at 77 K decreases with increasing thickness in the thickness range exceeding 0.4 μm, qualitatively consistent with the microstructural observation, but quantitatively inconsistent with a simple model based on the microstructural data

Additional details

Publishing Information

Publisher
Materials Research Society.
Imprint Place
Pittsburgh, PA (United States)
ISBN
1-55899-057-7
Imprint Title
High-temperature superconductors: Fundamental properties and novel materials processing
Imprint Pagination
1322 p.
Journal Page Range
p. 703-706.

Conference

Title
Materials Research Society fall meeting.
Dates
27 Nov - 2 Dec 1989.
Place
Boston, MA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
23018762
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; BARIUM OXIDES; COPPER OXIDES; CRITICAL CURRENT; CURRENT DENSITY; EVAPORATION; MICROSTRUCTURE; STRUCTURAL MODELS; SUBSTRATES; THICKNESS; TRANSMISSION ELECTRON MICROSCO; YTTRIUM OXIDES
Descriptors DEC
ALKALINE EARTH METAL COMPOUNDS; BARIUM COMPOUNDS; CHALCOGENIDES; COPPER COMPOUNDS; CRYSTAL STRUCTURE; CURRENTS; DIMENSIONS; ELECTRIC CURRENTS; ELECTRON MICROSCOPY; HEAT TREATMENTS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS

Optional Information

Secondary number(s)
CONF-891119--.