Published November 2007 | Version v1
Journal article

A far-infrared Fourier transform spectrometer with an antenna-coupled niobium bolometer

  • 1. Department of Applied Physics, Yale University, New Haven, CT 06520-8284 (United States)

Description

We have designed and constructed a custom far-infrared Fourier transform spectrometer using an antenna-coupled bolometer as a detector. The active element of the detector is a superconducting niobium microbridge, and the far-infrared signal is coupled to the microbridge via a planar antenna mounted on a hyperhemispherical silicon lens. The spectrometer uses a broadband blackbody source with frequency-independent optical components, and thus the system bandwidth is set by the detector antenna. We have fabricated devices with two different antenna types, the double dipole and the log spiral, and have characterized the spectral response of each. This spectrometer can utilize the fast response of the niobium bolometer to perform time-resolved far-infrared spectroscopy on nanosecond to millisecond timescales. These timescales are too fast for standard commercial bolometers and too long for a typical optical delay line

Additional details

Identifiers

DOI
10.1088/0953-2048/20/11/S19;
PII
S0953-2048(07)52343-2;

Publishing Information

Journal Title
Superconductor Science and Technology
Journal Volume
20
Journal Issue
11
Journal Page Range
p. S398-S402
ISSN
0953-2048
CODEN
SUSTEF

Conference

Title
11. international superconductive electronics conference
Acronym
ISEC 07
Dates
10-14 Jun 2007
Place
Washington, DC (United States)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39028950
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTROSCOPY; ANTENNAS; BOLOMETERS; DIPOLES; FOURIER TRANSFORM SPECTROMETERS; INFRARED SPECTRA; NIOBIUM; SILICON; SPECTRAL RESPONSE; TIME RESOLUTION
Descriptors DEC
ELECTRICAL EQUIPMENT; ELEMENTS; EQUIPMENT; MEASURING INSTRUMENTS; METALS; MULTIPOLES; REFRACTORY METALS; RESOLUTION; SEMIMETALS; SPECTRA; SPECTROMETERS; SPECTROSCOPY; TIMING PROPERTIES; TRANSITION ELEMENTS