Published February 3, 2014 | Version v1
Journal article

Ion beam sputtered aluminum based multilayer mirrors for extreme ultraviolet solar imaging

  • 1. Centre National d'Etudes Spatiales (CNES), 18 Avenue E. Belin, 31401 Toulouse (France)
  • 2. Laboratoire Charles Fabry, Institut d'Optique, CNRS, Univ Paris Sud, 2 Avenue Augustin Fresnel, 91127 Palaiseau cedex France (France)
  • 3. Institut d'Electronique et de Télécommunications de Rennes (IETR) UMR-CNRS 6164, Université de Rennes 1, UEB, IUT Saint Brieuc, 18 rue Henri Wallon, 22004 Saint Brieuc cedex France (France)
  • 4. Institut des Sciences Moléculaires d'Orsay UMR 8214, Univ Paris Sud, 91405 Orsay France (France)

Description

In this paper, we report on the design, synthesis and characterization of extreme ultraviolet interferential mirrors for solar imaging applications in the spectral range 17 nm–34 nm. This research is carried out in the context of the preparation of the European Space Agency Solar Orbiter mission. The purpose of this study consists in optimizing the deposition of Al-based multilayers by ion beam sputtering according to several parameters such as the ion beam current and the sputtering angle. After optimization of Al thin films, several kinds of Al-based multilayer mirrors have been compared. We have deposited and characterized bi-material and also tri-material periodic multilayers: aluminum/molybdenum [Al/Mo], aluminum/molybdenum/boron carbide [Al/Mo/B4C] and aluminum/molybdenum/silicon carbide [Al/Mo/SiC]. Best experimental results have been obtained on Al/Mo/SiC samples: we have measured reflectivity up to 48% at 17.3 nm and 27.5% at 28.2 nm on a synchrotron radiation source. - Highlights: • Design and synthesis of extreme ultraviolet interferential mirrors. • Optimization of aluminum thin films by adjusting several deposition parameters. • Comparison of results obtained with different types of Al-based multilayer mirrors. • Reflectivity up to 48% at 17.3 nm on a synchrotron radiation source

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2013.12.015

Additional details

Identifiers

DOI
10.1016/j.tsf.2013.12.015;
PII
S0040-6090(13)02061-0;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
552
Journal Page Range
p. 62-67
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.