Annealing effect on the properties of p- and n-type (Sb,Bi)2(Te,Se)3+x alloys prepared by different techniques

Effect of thermal treatment up to 660 K on electrophysical and structural parameters of the p-(Sb,Bi)2Te3+x and n-Bi2(Te,Se)3+x samples, obtained through various methods, nonalloyed and alloyed by tin and chloride correspondingly, is studied. It is established basic changes in the samples parameters take place during the first 24 hours of thermal breatment and are connected with annealing of electroactive point defects and mechanical damages. The highest stability and thermoelectric efficiency is specific for the alloys with such a cation-anion ratio, whereby the minimum of own electroactive point defects is observed before alloying but after annealing