Application of synchrotron radiation (Part 2). Stress evaluation using white X-rays

At the large synchrotron radiation facilities, SPring-8, 57 beam lines are currently in operation, and most of them use monochromatic X-rays. However, the original emitted lights contain various wavelengths, and these lights that do not pass through a spectroscope are called white X-rays. Stress measurement using white X-rays came on stage around the 1970s, and those with relatively low energy were used at that time. In the 1990s, the rise of the third-generation large-scale synchrotron radiation facilities represented by SPring-8 gradually made it easier to use high-energy white X-rays, and the studies have been conducted mainly in Europe and the United States. The energy dispersion method using a semiconductor detector (Solid State Detector: SSD) is generally applied to stress measurement using white X-rays. However, over the last few years, stress measurement using white X-rays has entered a major revolution stage with the development of detectors. This paper introduces the conventional stress measurement methods using the energy dispersion method, and also describes the stress measurement methods using white X-rays with new detectors. (A.O.)