Published February 2008 | Version v1
Journal article

Defect centers and thermoluminescence in Al2O3:Si,Ti

  • 1. Indian Institute of Technology, RSIC, Powai, Mumbai 400 076 (India)
  • 2. Radiological Physics and Advisory Division, Bhabha Atomic Research Centre, Mumbai 400085 (India)

Description

Al2O3:Si,Ti is a sensitive thermoluminescent phosphor. ESR studies have been carried out in order to study the characteristics of the defect centers and the TL peaks observed in this phosphor. Two types of ESR centers (center I and center II) have been identified in Al2O3:Si,Ti. Center I is characteristic of a species exhibiting an isotropic g-value 2.0096 with a line width of 50 G. Center II is also characterized by an isotropic g-value 1.9526 with a line width of about 40 G. Thermal decay of center I shows three different annealing stages in the temperature ranges 125-225 deg. C, 430-525 deg. C and 600-680 deg. C, which indicates correlation between center I and TL peaks at 175, 475 and 625 deg. C, respectively. Decay of center II in the region 600-700 de. C appears to relate with the TL peak around 625 deg. C

Availability note (English)

Available from http://dx.doi.org/10.1016/j.radmeas.2007.12.049

Additional details

Identifiers

DOI
10.1016/j.radmeas.2007.12.049;
PII
S1350-4487(08)00016-4;

Publishing Information

Journal Title
Radiation Measurements
Journal Volume
43
Journal Issue
2-6
Journal Page Range
p. 295-299
ISSN
1350-4487
CODEN
RMEAEP

Conference

Title
15. solid state dosimetry conference
Acronym
SSD15
Dates
8-13 Jul 2007
Place
Delft (Netherlands)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40008411
Subject category
S61: RADIATION PROTECTION AND DOSIMETRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM OXIDES; ANNEALING; CHEMICAL DOSEMETERS; DECAY; DEFECTS; ELECTRON SPIN RESONANCE; G VALUE; TEMPERATURE RANGE; THERMOLUMINESCENCE
Descriptors DEC
ALUMINIUM COMPOUNDS; CHALCOGENIDES; DOSEMETERS; EMISSION; HEAT TREATMENTS; LUMINESCENCE; MAGNETIC RESONANCE; MEASURING INSTRUMENTS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; RESONANCE

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.