Published September 2008 | Version v1
Journal article

Structure and oxide anion conductivity in Ln2(TO4)O (Ln=La, Nd; T=Ge, Si)

  • 1. Laboratorio de Difraccion de Rayos-X, Servicios Centrales de Apoyo a la Investigacion, Universidad de Malaga, 29071 Malaga (Spain)
  • 2. Departamento de Quimica Inorganica, Cristalografia y Mineralogia, Universidad de Malaga, 29071 Malaga (Spain)

Description

Oxy-silicate and oxy-germanate, Ln2(TO4)O (Ln=La and Nd, T=Ge and Si) compounds have been prepared. Oxy-germanates can be readily obtained as highly crystalline single phases, while, the oxy-silicates are difficult to prepare as pure phases. The crystal structure of Nd2(SiO4)O has been studied from a joint Rietveld refinement of neutron and laboratory X-ray powder diffraction data. The electrochemical characterisation indicates that these compounds display oxide anion conductivity with p-type electronic contribution under oxidising conditions. The apparent activation energies under dry flowing nitrogen, where p-type contribution is minimised, are 0.97(1), 1.05(3) and 1.17(4) eV, for Nd2(SiO4)O, La2(GeO4)O and Nd2(GeO4)O, respectively. The overall conductivities at 1173 K range from 1.2x10-4 S cm-1 for Nd2(SiO4)O to 1.3x10-6 S cm-1 for La2(GeO4)O. Finally, the stability of these compounds under very reducing conditions has been studied and partial degradation is reported. - Graphical abstract: Ln2(TO4)O oxy-silicates and oxy-germanates show ionic conductivities ∼10-4 S cm-1 at 1173 K with p-type electronic contribution under oxidising conditions. Furthermore, the studied materials are not stable under strongly reducing conditions as shown in the attached figure. Display Omitted

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jssc.2008.06.029

Additional details

Identifiers

DOI
10.1016/j.jssc.2008.06.029;
PII
S0022-4596(08)00330-7;

Publishing Information

Journal Title
Journal of Solid State Chemistry
Journal Volume
181
Journal Issue
9
Journal Page Range
p. 2501-2506
ISSN
0022-4596
CODEN
JSSCBI

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.