Research on Nonlinear Opto-Mechanical System for Improving Detection Performance
Creators
- 1. School of Physics and Materials Science of Anhui University, Hefei, Anhui, 230601 (China)
- 2. College of Ocean Science and Engineering, Shandong University of Science and Technology, Qingdao, Shandong, 253300 (China)
- 3. College of Science, Changchun University of Science and Technology, Changchun, Jilin, 130000 (China)
Description
In this paper, the use of optical parametric amplifier to effectively improve the detection performance of nonlinear opto-mechanical system is studied theoretically. At the same time, it is found that by adjusting the nonlinear gain of the optical parametric amplifier and the effective detuning between the input light field and the cavity field, the quantum noise of about 14dB in the squeezed quadrature can be reduced, and the sensitivity of weak force detection can be increased by more than 2 times. On the other hand, the phenomenon of reaction noise cancellation caused by nonlinear cavity combined with homodyne measurement is analyzed and the method of quantum non-destructive measurement is realized, which provides technical reference for weak force detection of nonlinear opto-mechanical system. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1865/2/022005Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1865
- Journal Issue
- 2
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
Conference
- Title
- International Conference on Advances in Optics and Computational Sciences (ICAOCS)
- Dates
- 21-23 Jan 2021
- Place
- Ottawa (Canada)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54098296
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DETECTION; GAIN; NOISE; NONLINEAR PROBLEMS; PARAMETRIC AMPLIFIERS; PERFORMANCE; SENSITIVITY
- Descriptors DEC
- AMPLIFICATION; AMPLIFIERS; ELECTRONIC EQUIPMENT; EQUIPMENT