Published April 1, 2021 | Version v1
Journal article

Research on Nonlinear Opto-Mechanical System for Improving Detection Performance

  • 1. School of Physics and Materials Science of Anhui University, Hefei, Anhui, 230601 (China)
  • 2. College of Ocean Science and Engineering, Shandong University of Science and Technology, Qingdao, Shandong, 253300 (China)
  • 3. College of Science, Changchun University of Science and Technology, Changchun, Jilin, 130000 (China)

Description

In this paper, the use of optical parametric amplifier to effectively improve the detection performance of nonlinear opto-mechanical system is studied theoretically. At the same time, it is found that by adjusting the nonlinear gain of the optical parametric amplifier and the effective detuning between the input light field and the cavity field, the quantum noise of about 14dB in the squeezed quadrature can be reduced, and the sensitivity of weak force detection can be increased by more than 2 times. On the other hand, the phenomenon of reaction noise cancellation caused by nonlinear cavity combined with homodyne measurement is analyzed and the method of quantum non-destructive measurement is realized, which provides technical reference for weak force detection of nonlinear opto-mechanical system. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/1865/2/022005

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
1865
Journal Issue
2
Journal Page Range
[6 p.]
ISSN
1742-6596

Conference

Title
International Conference on Advances in Optics and Computational Sciences (ICAOCS)
Dates
21-23 Jan 2021
Place
Ottawa (Canada)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
54098296
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DETECTION; GAIN; NOISE; NONLINEAR PROBLEMS; PARAMETRIC AMPLIFIERS; PERFORMANCE; SENSITIVITY
Descriptors DEC
AMPLIFICATION; AMPLIFIERS; ELECTRONIC EQUIPMENT; EQUIPMENT