Published 2018 | Version v1
Journal article

Effect of ionising radiation defect on electrical properties of the double-barrier structure based on silicon

Creators

  • 1. Institute of Radiation Problems of ANAS, Baku (Azerbaijan)

Description

Developed and analyzed silicon-based photo detector with high sensitivity integrated in the short range. The effect of gamma radiation on the mechanism of current transport in the structure type Schottky barrier, and in the p-n junctions. It is shown that the double-barrier structure can improve the photovoltaic parameters of conventional detectors. We studied the effect of gamma radiation on the origin of the current mechanism in the structure as a whole, and in the Schottky barrier in the p - n - transitions separately. Also studied the effect of radiation on the photoelectric and photoluminescence parameters of the two barrier structure. Shown that two barrier structures can improve the photoelectric parameters of conventional detectors. The photo detector on the basis of silicon with the increased integrated sensitivity in short-wave area of a range is developed. Influence radiation scale on the mechanism of a currents of both in structure like Schottky s barrier, and in p - Π - transitions is investigated. It is shown that two barrier structures allow to improve photo-electric parameters of traditional detectors. Investigated the impact of radiation on the photoelectric and photoluminescence parameters of two-barrier structures.

Additional details

Publishing Information

Journal Title
Journal of Radiation Researches
Journal Volume
5
Journal Issue
2
Journal Page Range
p. 154-161
ISSN
2312-3001

INIS

Country of Publication
Azerbaijan
Country of Input or Organization
Azerbaijan
INIS RN
50035859
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
IONIZING RADIATIONS; SCHOTTKY BARRIER DIODES; SILICON
Descriptors DEC
ELEMENTS; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS

Optional Information

Notes
12 refs.; 7 figs.