Published November 2011
| Version v1
Journal article
Using image registration method to correct AFM image distortion induced thermal drift
Creators
- 1. School of Life Sciences and Biotechnology, Shanghai Jiaotong University, Shanghai (China)
- 2. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai (China)
Description
Under ambient conditions, thermal drift would limit positioning precision of an AFM tip, resulting in distortion of the scanned image. To remove this kind of imaging error, we developed a thermal drift compensation method based on image registration techniques. The image distortion can be efficiently removed, and the sample topography can be truly restored. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Techniques
- Journal Volume
- 34
- Journal Issue
- 11
- Journal Page Range
- p. 877-880
- ISSN
- 0253-3219
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 43075714
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; ATOMIC FORCE MICROSCOPY; ERRORS; IMAGE PROCESSING; IMAGES; POSITIONING; TOPOGRAPHY
- Descriptors DEC
- MICROSCOPY; PROCESSING
Optional Information
- Notes
- 3 figs., 21 refs.