Published May 2006
| Version v1
Journal article
The impact of unintentional discrete charges in a nominally undoped channel of a thin body double gate MOSFET: classical to full quantum simulation
- 1. Nanoelectronics Research Centre, Department of Electronics and Electrical Engineering, University of Glasgow, G12 8LT, Scotland (United Kingdom)
- 2. Nasa Ames Research Center, MS:229-1, Moffett Field, California 94035-1000 (United States)
Description
A comparison of full quantum device simulation with semi-classical methods is made for an unintended single atomistic dopant at various locations in a 10 nm double gate MOSFET transistor. The density gradient method comes closest to the non-equilibrium Green function results for fails seriously when the unwanted charge is located well-within the channel
Availability note (English)
Available online at http://stacks.iop.org/1742-6596/38/192/jpconf6_38_046.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 38
- Journal Issue
- 1
- Journal Page Range
- p. 192-195
- ISSN
- 1742-6596
Conference
- Title
- 7. international conference on new phenomena in mesoscopic structures; 5. international conference on surfaces and interfaces of mesoscopic devices
- Dates
- 27 Nov - 2 Dec 2005
- Place
- Maui, HI (United States)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38028654
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; DENSITY; EQUILIBRIUM; GATING CIRCUITS; GREEN FUNCTION; MOSFET; QUANTUM MECHANICS; SEMICLASSICAL APPROXIMATION
- Descriptors DEC
- APPROXIMATIONS; CALCULATION METHODS; ELECTRONIC CIRCUITS; EVALUATION; FIELD EFFECT TRANSISTORS; FUNCTIONS; MECHANICS; MOS TRANSISTORS; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES; SIMULATION; TRANSISTORS