A soft-x-ray emission spectrometer equipped with a multilayer analyzer applicable to the polarization measurement

We have developed a new instrument for soft-x-ray emission spectroscopy. The spectrometer consists of a flat-field grating and a multi-channel detector. A rotating analyzer mounted with a soft-x-ray multilayer is also installed for measuring polarization degree of the x-ray emission. From the energy calibration the energy resolution (E/ΔE) was estimated at 430 to 110 in the energy region of 62 eV to 248 eV. The higher orders were found to be useful for the high-resolution spectroscopy. By using monochromatic synchrotron radiation we have observed new excitation-energy dependence of the B K emission spectrum at the low-absorption region in h-BN. The result shows that our instrument is quite capable of carrying out the soft-x-ray emission spectroscopy. (author)