Published November 22, 2005 | Version v1
Journal article

Visualization of thermally-activated degradation pathways of tris(8-hydroxyquinoline) aluminum thin films for electroluminescence application

  • 1. Department of Electronic Engineering, The Chinese University of Hong Kong, Shatin, NT, Hong Kong (China)

Description

By exploiting variable-temperature tapping modeTM atomic force microscopy in O2 and N2, the thermally activated degradation pathways of the tris(8-hydroxyquinoline) aluminum (Alq3) thin film on indium-tin-oxide coated glass substrate have been studied as functions of temperature and time. Results suggest that the Alq3 thin film was thermally and chemically stable up to 125 deg. C in O2 and N2 atmospheres. No thermal oxidation of the thin film was detected by Fourier transform infrared spectroscopy. Apparent glass transition of the Alq3 thin film took place at 130 deg. C, well below the generally reported glass transition temperature of 170 deg. C or so. Crystallization of the Alq3 thin film occurred at 185 deg. C

Additional details

Identifiers

DOI
10.1016/j.tsf.2005.05.025;
PII
S0040-6090(05)00546-8;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
491
Journal Issue
1-2
Journal Page Range
p. 317-322
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.