Published November 22, 2005
| Version v1
Journal article
Visualization of thermally-activated degradation pathways of tris(8-hydroxyquinoline) aluminum thin films for electroluminescence application
Description
By exploiting variable-temperature tapping modeTM atomic force microscopy in O2 and N2, the thermally activated degradation pathways of the tris(8-hydroxyquinoline) aluminum (Alq3) thin film on indium-tin-oxide coated glass substrate have been studied as functions of temperature and time. Results suggest that the Alq3 thin film was thermally and chemically stable up to 125 deg. C in O2 and N2 atmospheres. No thermal oxidation of the thin film was detected by Fourier transform infrared spectroscopy. Apparent glass transition of the Alq3 thin film took place at 130 deg. C, well below the generally reported glass transition temperature of 170 deg. C or so. Crystallization of the Alq3 thin film occurred at 185 deg. C
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2005.05.025;
- PII
- S0040-6090(05)00546-8;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 491
- Journal Issue
- 1-2
- Journal Page Range
- p. 317-322
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37023117
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; ELECTROLUMINESCENCE; FOURIER TRANSFORM SPECTROMETERS; GLASS; INDIUM OXIDES; ORGANIC SEMICONDUCTORS; OXINE; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; TIN OXIDES; TRANSITION TEMPERATURE
- Descriptors DEC
- AROMATICS; AZAARENES; AZINES; CHALCOGENIDES; EMISSION; FILMS; HETEROCYCLIC COMPOUNDS; HYDROXY COMPOUNDS; INDIUM COMPOUNDS; LUMINESCENCE; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHOTON EMISSION; PHYSICAL PROPERTIES; PYRIDINES; QUINOLINES; SEMICONDUCTOR MATERIALS; SPECTROMETERS; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TIN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.