Published September 10, 2009 | Version v1
Journal article

'Programming' Electron Beam Ion Traps To Produce Atomic Data Relevant To Plasma Physics

  • 1. School of Maths and Physics, Queen's University, Belfast BT7 1NN (United Kingdom)
  • 2. Joint Department of Physics, The Royal Marsden NHS Foundation Trust, London SM2 5PT (United Kingdom)
  • 3. Institute of Applied Physics and Computational Mathematics, P.O.Box 8009, Beijing 100088 (China)
  • 4. Insitute for Laser Science, University of ElectroCommunications, Tokyo, T182 (Japan)
  • 5. Chubu University, 1200 Matsumoto-cho, Kasugai, 487-8501 (Japan)

Description

After a brief review of the processes taking place in electron beam ions traps (EBITs), the means by which EBITs are used to make measurements of electron impact ionization cross-sections and dielectronic recombination resonance strengths are discussed. In particular, results from a study involving holmium ions extracted from an electron beam ion trap are used to illustrate a technique for studying dielectronic recombination in open-shell target ions.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1161
Journal Issue
1
Journal Page Range
p. 87-94
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
16. international conference on atomic processes in plasmas
Dates
22-26 Mar 2009
Place
Monterey, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41075537
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CROSS SECTIONS; ELECTRON BEAMS; ELECTRON COLLISIONS; ELECTRONS; HOLMIUM IONS; IONIZATION; PLASMA; RECOMBINATION; RESONANCE; TRAPS; X RADIATION
Descriptors DEC
BEAMS; CHARGED PARTICLES; COLLISIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; IONIZING RADIATIONS; IONS; LEPTON BEAMS; LEPTONS; PARTICLE BEAMS; RADIATIONS

Optional Information

Notes
(c) 2009 American Institute of Physics