Published April 1, 2009
| Version v1
Journal article
Ultrahigh-Hc granular media with [CoB/Pt]n multilayer film sputtered under Ar+O2 atmosphere
- 1. Storage Device Department, Central Research Laboratory, Hitachi, Ltd., 2880 Kozu, Odawara-shi, Kanagawa 256-8510 (Japan)
- 2. Department of Materials Science and Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita-shi, Osaka 565-0871 (Japan)
Description
We developed a [Co/Pt]n multilayer film for fabricating a perpendicular recording film with an ultrahigh coercivity (Hc). Adding boron into each Co layer and further introducing O2 during deposition yielded a high Hc of 1200 kA/m. Transmission electron microscopy and magnetic measurements suggested that the intergranular exchange coupling was reduced to the level of conventional CoCrPt-oxide granular films. The [CoB/Pt]n+O multilayer film is applicable to a hard magnetic layer in exchange-coupled composite media as well as energy-assisted magnetic recording media
Additional details
Identifiers
- DOI
- 10.1063/1.3059608;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 105
- Journal Issue
- 7
- Journal Page Range
- p. 07B705-07B705.3
- ISSN
- 0021-8979
- CODEN
- JAPIAU
Conference
- Title
- 53. annual conference on magnetism and magnetic materials
- Dates
- 10-14 Nov 2008
- Place
- Austin, TX (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40062413
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANISOTROPY; ARGON; ATMOSPHERES; BORON ALLOYS; COBALT ALLOYS; COERCIVE FORCE; LAYERS; OXYGEN; PLATINUM; SPUTTERING; SURFACE COATING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; DEPOSITION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; FLUIDS; GASES; METALS; MICROSCOPY; NONMETALS; PLATINUM METALS; RARE GASES; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2009 American Institute of Physics