Functionalized Akiyama tips for magnetic force microscopy measurements
Creators
- 1. Division of Superconductivity and Magnetism, Felix-Bloch Institute for Solid-state Physics, University of Leipzig, 04103 Leipzig (Germany)
- 2. Laboratorio de Microscopías Avanzadas (LMA), Instituto de Nanociencia de Aragón (INA), Universidad de Zaragoza, E-50018 Zaragoza (Spain)
- 3. Division of Nuclear Solid State Physics, Felix-Bloch Institute for Solid-state Physics, University of Leipzig, 04103 Leipzig (Germany)
- 4. Leibniz Institute of Surface Modification, 04318 Leipzig (Germany)
Description
In this work we have used focused electron beam induced deposition of cobalt to functionalize atomic force microscopy Akiyama tips for application in magnetic force microscopy. The grown tips have a content of ≈ Co after exposure to ambient air. The magnetic tips were characterized using energy dispersive x-ray spectroscopy and scanning electron microscopy. In order to investigate the magnetic properties, current loops were prepared by electron beam lithography. Measurements at room temperature as well as were carried out and the coercive field of ≈ mT of the Co tip was estimated by applying several external fields in the opposite direction of the tip magnetization. Magnetic Akiyama tips open new possibilities for wide-range temperature magnetic force microscopy measurements. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6501/aa925eAdditional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 28
- Journal Issue
- 12
- Journal Page Range
- [7 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51043636
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AIR; ATOMIC FORCE MICROSCOPY; COBALT; DEPOSITION; ELECTRON BEAMS; MAGNETIC FIELDS; MAGNETIC PROPERTIES; MAGNETIZATION; SCANNING ELECTRON MICROSCOPY; X-RAY SPECTROSCOPY
- Descriptors DEC
- BEAMS; ELECTRON MICROSCOPY; ELEMENTS; FLUIDS; GASES; LEPTON BEAMS; METALS; MICROSCOPY; PARTICLE BEAMS; PHYSICAL PROPERTIES; SPECTROSCOPY; TRANSITION ELEMENTS