Electron beam microanalysis - especially for the light elements boron to fluorine
Description
With the fast expanding application of the electron microprobe analysis, the present detectable range of elements has been extended to the light elements e.g. boron to fluorine. This method is essential to the study of quantitative, non-destructive determination of the local distribution of elements in the micron range of solids. In this short communication the main features of the microanalysis of light elements will be reported in comparison with those of the heavier elements. Accordingly, a concise account of the mode of operation, the techniques of measurement and data pertaining to the analysed elements is furnished. The results of research on the dependance of contamination, the energy and intensity of soft radiation, the porosity and electrical conductivity of the specimens, as well as the question of standards, are indicated. (orig.)
Abstract (German)
Wenn es darum geht, eine lokale Elementaranalyse eines Festkoerpers von Tausendstel zu Tausendstel Millimeter ausfuehren zu muessen, bietet sich als derzeit einzige Methode die Elektronenstrahl-Mikroanalyse an. Dieses technisch vor 15 Jahren konzipierte roentgenspektroskopische Verfahren arbeitet nicht nur schnell, praktisch zerstoerungsfrei und nicht radioaktiv, sondern auch in situ quantitativ mit lokaler Aufloesung des Mikrobereiches und mit Analysengenauigkeiten vergleichbar der chemischen Nassanalyse. Die gegenueber der Mikrobereichsanalyse schwerer Elemente auftretenden Besonderheiten werden heute weitgehend beherrscht, aber auch die Grenzen der Aufloesung, des Nachweises und des Apparateaufwandes erkannt. (orig.)Additional details
Additional titles
- Subtitle (English)
- Analytics, technical solid state chemistry, microanalysis, microprobes, characteristic X-rays, electron beams, light elements
- Original title (German)
- Festkoerper-Analyse: Elektronenstrahl-Mikrobereichsanalyse, speziell der leichten Elemente Bor bis Fluor
- Original subtitle (German)
- Analytik, Technische Feststoffchemie, Mikroanalyse, Mikrosonde, charakteristische Roentgenstrahlen, Elektronenstrahlen, leichte Elemente.
Publishing Information
- Journal Title
- G-I-T (Glas- Instrum.-Tech.) Fachz. Lab.
- Journal Volume
- 22
- Journal Issue
- 6
- Series
- G-I-T (Glas- Instrum.-Tech.) Fachz. Lab.
- Journal Page Range
- 488-492
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 10420235
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S42: ENGINEERING;
- Descriptors DEI
- BORON; CARBON; ELECTRON BEAMS; ELECTRON MICROPROBE ANALYSIS; ELECTRON PROBES; FLUORINE; MICROANALYSIS; NITROGEN; OXYGEN; QUANTITATIVE CHEMICAL ANALYSIS; SOLIDS; TITANIUM BORIDES; TITANIUM CARBIDES; TITANIUM FLUORIDES; TITANIUM NITRIDES; TITANIUM OXIDES; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BEAMS; BORIDES; BORON COMPOUNDS; CARBIDES; CARBON COMPOUNDS; CHALCOGENIDES; CHEMICAL ANALYSIS; ELEMENTS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; HALOGENS; LEPTON BEAMS; NITRIDES; NITROGEN COMPOUNDS; NONDESTRUCTIVE ANALYSIS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PROBES; SEMIMETALS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; X-RAY EMISSION ANALYSIS