Automation of an X-ray diffractometer by means of a microcomputer

For the fully automated registration of the scattering curves in the small angle X-ray region and the wide angle X-ray region a modified X-ray diffractometer HZG 3 was coupled with the microcomputer MPS 4944. Using this diffractometer system the scanning of scattering curves of polycrystalline and amorphous materials and of solutions in transmission is possible in a scattering angle region from s = 0.3 nm-1 to s = 40.7 nm-1 (s = 4 π lambda-1 sin THETA, lambda = 0.154 nm). The effectiveness of the diffractometer system was proved by the example of the measured scattering curves of human serum albumin, human serum albumin-sodium dodecyl sulfate-complex, immunoglobulin G and of a maltodextrin gel. The coupling of a microcomputer to the X-ray diffractometer afforded an increase of precision of measurement, shortening of the time needed for the scattering experiment and the adjustment, and improved the handling comfort of the diffractometer. (author)