Published May 2007 | Version v1
Journal article

Design and performance of a curved-crystal x-ray emission spectrometer

  • 1. Laboratoire de Chimie Physique-Matiere et Rayonnement, Universite Pierre et Marie Curie-CNRS, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05 (France)
  • 2. University of Nevada, Las Vegas, Nevada 89154 (United States)

Description

A curved-crystal x-ray emission spectrometer has been designed and built to measure 2-5 keV x-ray fluorescence resulting from a core-level excitation of gas phase species. The spectrometer can rotate 180 deg., allowing detection of emitted x rays with variable polarization angles, and is capable of collecting spectra over a wide energy range (20 eV wide with 0.5 eV resolution at the Cl K edge) simultaneously. In addition, the entire experimental chamber can be rotated about the incident-radiation axis by nearly 360 deg. while maintaining vacuum, permitting measurements of angular distributions of emitted x rays

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
78
Journal Issue
5
Journal Page Range
p. 053101-053101.5
ISSN
0034-6748
CODEN
RSINAK

Optional Information

Notes
(c) 2007 American Institute of Physics