Lithium ion implantation effects in MgO(100)
Creators
- 1. Interfaculty Reactor Inst., Delft Univ. of Technology, Delft (Netherlands)
- 2. Rijksuniversiteit Groningen (Netherlands). Materials Science Centre
Description
Single crystals of MgO(100) were implanted with 10166Li ions cm-2 at an energy of 30 keV. After ion implantation the samples were annealed isochronally in air at temperatures up to 1200K. After implantation and after each annealing step, the defect evolution was monitored with optical absorption spectroscopy and depth-sensitive Doppler Broadening positron beam analysis (PBA). A strong increase in the S-parameter is observed in the implantation layer at a depth of approximately 100 nm. The high value of the S-parameter is ascribed to positron annihilation in small lithium precipitates. The results of 2D-ACAR and X-TEM analysis show evidence of the presence of lithium precipitates. The depth distribution of the implanted 6Li atoms was monitored with neutron depth profiling (NDP). It was observed that detrapping and diffusion of 6Li starts at an annealing temperature of 1200K. (orig.)
Additional details
Publishing Information
- Journal Title
- Materials Science Forum
- Journal Volume
- 363-365
- Journal Page Range
- p. 448-450
- ISSN
- 0255-5476
- CODEN
- MSFOEP
Conference
- Title
- 12. international conference on positron annihilation
- Acronym
- ICPA-12
- Dates
- 6-12 Aug 2000
- Place
- Munich (Germany)
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 32030971
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTRA; ANGULAR CORRELATION; ANNEALING; ANNIHILATION; DOPPLER BROADENING; ION IMPLANTATION; KEV RANGE 10-100; LITHIUM IONS; MAGNESIUM OXIDES; MONOCRYSTALS; POSITRON BEAMS; PRECIPITATION; RADIATION DOSES; TEMPERATURE RANGE 0400-1000 K; TEMPERATURE RANGE 1000-4000 K; TRANSMISSION ELECTRON MICROSCOPY; TRAPPING; VISIBLE SPECTRA
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BEAMS; CHALCOGENIDES; CHARGED PARTICLES; CORRELATIONS; CRYSTALS; DOSES; ELECTRON MICROSCOPY; ENERGY RANGE; HEAT TREATMENTS; INTERACTIONS; IONS; KEV RANGE; LEPTON BEAMS; LINE BROADENING; MAGNESIUM COMPOUNDS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PARTICLE INTERACTIONS; SEPARATION PROCESSES; SPECTRA; TEMPERATURE RANGE
Optional Information
- Notes
- 8 refs.