Published June 1, 2011 | Version v1
Journal article

Charge exchange of He+-ions with aluminium surfaces

  • 1. Institut fuer Experimentalphysik, Abt. Atom - und Oberflaechenphysik, Johannes Kepler Universitaet, Altenbergerstr 69, A-4040 Linz (Austria)

Description

Charge exchange of 4He+ and 3He+ ions with surfaces of polycrystalline aluminium and Al(1 1 1) was investigated in the low-energy ion scattering (LEIS) regime. Ion spectra were recorded for primary energies ranging from 280 to 4000 eV by using an electrostatic analyzer (ESA). A very low threshold energy Eth for collision induced charge exchange (CI) was deduced from the shape of experimental spectra. Ion fractions P+ were evaluated. No systematic difference in P+ was observed for both, the two surfaces investigated and the two different projectiles.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2010.11.049

Additional details

Identifiers

DOI
10.1016/j.nimb.2010.11.049;
PII
S0168-583X(10)00882-7;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
269
Journal Issue
11
Journal Page Range
p. 1171-1174
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
18. international workshop on inelastic ion-surface collisions
Acronym
IISC-18
Dates
26 Sep - 1 Oct 2010
Place
Gatlinburg, TN (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43055772
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM; CHARGE EXCHANGE; COLLISIONS; ELECTROSTATIC ANALYZERS; EV RANGE; HELIUM IONS; PHOSPHORUS IONS; POLYCRYSTALS; SCATTERING; SPECTRA; SURFACES; THRESHOLD ENERGY
Descriptors DEC
BEAM ANALYZERS; CHARGED PARTICLES; CRYSTALS; ELEMENTS; ENERGY; ENERGY RANGE; IONS; METALS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.