Published August 2017 | Version v1
Miscellaneous Metadata-only

Cavity performance of IHEP-04 9-cell cavity at KEK

Creators

  • 1. Nippon Advanced Technology Co., Ltd., Tokai, Ibaraki (Japan)
  • 2. High Energy Accelerator Research Organization (KEK), Tsukuba, Ibaraki (Japan)
  • 3. Institute of High Energy Physics (IHEP), Beijing (China)

Description

A TESLA type 9-cell superconducting RF cavity (IHEP-04) was produced by IHEP. The vertical test was carried out after a series of the process like inspection of inner surface, electric field distribution measurement, anneal and electropolishing at KEK. The IHEP-04 achieved Eacc,max of 23.9 MV/m with Q0 value of 7.4×109. The vertical test results of IHEP-04 are reported in this paper. (author)

Part of:
Proceedings of the 14th annual meeting of Particle Accelerator Society of Japan

Additional details

Identifiers

URL
https://www.pasj.jp/web_publish/pasj2017/proceedings/;

Publishing Information

Imprint Title
Proceedings of the 14th annual meeting of Particle Accelerator Society of Japan
Imprint Pagination
[1427 p.]
Journal Page Range
p. 934-936

Conference

Title
14. annual meeting of Particle Accelerator Society of Japan
Acronym
PASJ2017
Dates
1-3 Aug 2017
Place
Sapporo, Hokkaido (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
49041148
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ANNEALING; DOSE RATES; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; ELECTROPOLISHING; ENERGY LOSSES; GEOMAGNETIC EQUATOR; INSPECTION; KEK; QUENCHING; Q-VALUE; RADIATION DETECTORS; RADIATION DOSES; SUPERCONDUCTING CAVITY RESONATORS; X-RAY DETECTION
Descriptors DEC
CAVITY RESONATORS; DETECTION; DOSES; ELECTRICAL PROPERTIES; ELECTROLYSIS; ELECTRONIC EQUIPMENT; ENERGY; EQUIPMENT; HEAT TREATMENTS; JAPANESE ORGANIZATIONS; LOSSES; LYSIS; MEASURING INSTRUMENTS; NATIONAL ORGANIZATIONS; PHYSICAL PROPERTIES; POLISHING; RADIATION DETECTION; RESONATORS; SUPERCONDUCTING DEVICES; SURFACE FINISHING

Optional Information

Notes
5 refs., 5 figs., 3 tabs.