High resolution in EXAFS data analysis of multilayer nanostuctures

The regularization method of solving ill-posed problem is used to determine three partial interatomic distances from one EXAFS spectrum. The mathematical procedure and the experimental results of the EXAFS analysis for multilayer FeNi/V nanostructures are discussed. The measurements were performed using ESRF facilities (BM line 26A, Grenoble, France). The Fe, Ni and V edge absorption spectra were recorded in fluorescence and transmission modes at room temperature for foils Fe, Ni, V and for multilayer nanostructures [Fe82Ni18(5ML)/V(6ML)]25, [Fe82Ni18(10ML)/V(6ML)]25, films Fe82Ni18, Fe, Ni, V (1000 A thickness) in fluorescence mode only. All film samples were prepared at University Uppsala (Sweden). Peculiar features of the method are high resolution for overlapping in r-space shells and high accuracy in the determination of partial interatomic distances.